In this section comparators design is explored using different techniques. Such as a static and dynamic CMOS logic
Design of comparator using a static and dynamic CMOS logic: Pull-up and pull-down networks play a crucial role in electronic circuits by providing specific functions.
These networks are designed to ensure there is no direct connection between the power supply (Vcc) and ground (GND) during steady-state conditions, preventing short circuits and ensuring circuit reliability. Devices incorporating Pull-Up Networks (PUN) or Pull-Down Networks (PDN) are known for their strong drive capability, offering high immunity to noise. These networks help enhance the circuit’s robustness and signal integrity by minimizing the impact of external disturbances.
When both the pull-up and pull-down networks are turned off, the circuit’s output enters a high impedance state. This state effectively disconnects the output from the rest of the circuit, making it useful for various applications. Memory elements, tri-state bus drives, multiplexers, buffers, and other components take advantage of this high impedance state for proper operation. However, it is generally undesirable to have both the pull-up and pull-down networks active simultaneously, as it results in a crowbarred level. This condition creates a direct connection between Vcc and GND, potentially leading to excessive current flow and circuit damage or disruption.
Author(s) Details:
Ch. Ganesh,
Electronics and Communication Engineering, VNR Vignana Jyothi Institute of Engineering and Technology, Hyderabad, India.
T. Sravan Kumar,
Electronics and Communication Engineering, VNR Vignana Jyothi Institute of Engineering and Technology, Hyderabad, India.
S. Pallavi,
Electronics and Communication Engineering, VNR Vignana Jyothi Institute of Engineering and Technology, Hyderabad, India.
G. Sai Preetham Reddy,
Electronics and Communication Engineering, VNR Vignana Jyothi Institute of Engineering and Technology, Hyderabad, India.